DFT :

Content

·         Introduction – Current Problems with Test 
·         Fault Models  
·         Automatic Test Pattern Generation
·         Design For Test (DFT) Introduction  
·         DC Scan 
·         AC Scan 
·         Boundary Scan 1149.1 IEEE Standard - JTAG  
·         Built-In Self-Test (BIST)  
·         IO BIST – Reduced Pin Count Testing (RPCT)
·         DFT and ATE systems  

Textbooks 

·         "Design-For-Test For Digital IC's and Embedded Core Systems" by A. Crouch
·         "Digital Systems Testing and Testable Design" by M. Abramovici, M. A. Breuer, and A. D. Friedman
·         "Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits" by M. Bushnell and V. Agrawal